Scanning Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES)

Model：

HD-ICP1

Introduction：

Scanning Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) analyzes major, minor and trace elements with high precision and wide dynamic range. Widely used for environmental, geological, metallurgy and material analysis....

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Technical Specifications
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I. Application Range and Features

The inductively coupled plasma optical emission spectrometer (ICP-OES) has outstanding anti-interference and analytical detection performance. It is used in high-end analysis needs such as R&D and testing, and can conveniently perform qualitative, semi-quantitative and precise quantitative analysis. It is an ideal instrument for simultaneous analysis of major, minor and trace inorganic elements.

High precision and wide dynamic range: supports precise analysis from major to trace elements with outstanding anti-interference capability, meeting diverse analysis needs.

Flexible RF power supply system: power continuously adjustable from 400 W to 1800 W; low-power mode reduces argon consumption and adapts to the analysis of a variety of complex samples.

Multi-functional observation modes: provides axial, radial and other observation methods; the signal automatic attenuation function simplifies sample handling and improves detection efficiency.

Advanced optical design: a thermostatic optical system and a high-resolution grating ensure long-term stability and accuracy and effectively resist the influence of ambient temperature changes.

Friendly software platform: a full Chinese graphical interface that is easy to operate, supports remote diagnosis and maintenance, and facilitates the generation of test reports and data management.

Optimized sample introduction system: adopts MFC-controlled gas flow and optional diversified sample introduction systems (such as high-salt-resistant or HF-resistant) to adapt to various sample conditions.

II. Working Environment

Voltage	220 V AC ±10%
Room temperature	Ambient temperature (25-50) ℃
Relative humidity	(50-70)% RH

III. Technical Specifications

Plasma RF source	Solid-state RF power supply, power range 400 W-1800 W, continuously adjustable, with stronger sample adaptability.
RF generator	Self-excited RF generator: extremely fast oscillation matching at startup, strong power load capacity, able to directly analyze 100% toluene samples; automatic oscillation tuning; water-cooled heat dissipation; adapts to power switching for complex sample analysis, shock-resistant and interference-resistant and reliable.
Low-power mode	Provides 400 W ultra-low power standby with a small-flow mini torch, reducing argon consumption by more than 50%; argon consumption in standby ≤5 L/min.
Plasma observation	Configurable in four observation modes: axial, radial, bidirectional and simultaneous bidirectional. The vertical torch avoids high-salt deposition, extending torch life and reducing torch consumable costs. Axial observation uses a metal cold cone to remove the tail flame, obtaining higher sensitivity with no need for an air compressor, saving external accessories and consumables. The radial observation plasma observation position is adjustable, providing stronger anti-interference capability for the analysis needs of different elements.
Signal automatic attenuation	With axial and radial attenuation functions, able to attenuate samples with a content above 30%, so that high-content elements in a sample can be analyzed in a single run without repeated dilution, reducing sample pretreatment difficulty and supporting simplified analysis.
RF frequency	27.12 MHz/40.68 MHz (optional), efficiency greater than 75%.
RF power / frequency stability	RF power stability ≤0.05%; RF frequency stability ≤0.01%.
Working coil	Copper tube inner diameter 25 mm / 3 turns.
Quartz torch	Three-concentric type, outer diameter 20 mm.
Nebulizer	Universal high-salt-resistant nebulizer, outer diameter 6-6.2 mm.
Spray chamber	Double-barrel / cyclone spray chamber.
Optical system	Thermostatic optical system, C-T optical path design with few reflections and low light energy loss. All optical elements are sealed in a thermally balanced light chamber; the main unit and light chamber are thermally isolated, better resisting external ambient temperature changes; the light chamber is precisely thermostatically controlled at 35 ℃ ±0.1 ℃.
Grating spectroscopy	Stable and efficient fully fixed high-resolution grating spectroscopy system, strong shock resistance, stable and reliable.
Wavelength range	165-850 nm, three-grating full-wavelength coverage.
Monochromator	Uses a concave mirror instead of a convex lens as the optical focusing element, solving the chromatic aberration problem caused by different focal points for different elements and improving optical system efficiency.
Grating type	Ion-etched holographic grating; the more lines, the higher the resolution (2400 L / 3600 L / 4320 L gratings available).
Wavelength calibration	At each ignition, only Ar spectral lines are used for automatic spectral position calibration, ensuring the correctness of the analysis wavelength, with no wavelength calibration solution required.
Argon line real-time calibration	Uses interference-free argon characteristic lines for real-time correction of slight spectral shifts, achieving optimal spectral integration, ensuring long-term stability and effectively eliminating the influence of spectral drift on measurement.
Purged light chamber	For the determination of wavelengths below 190 nm, nitrogen is selected for optical path purging.
Stray light	≤2.0 mg/L (10000 mg/L Ca solution measured at As 188.980 nm).
Optical resolution	0.007 nm (3600-line grating); 0.014 nm (2400-line grating); 0.004 nm (4320-line grating).
Detector	Dedicated imported Hamamatsu detector (R928/R212UH).
Anti-saturation overflow	Back-illuminated anti-overflow design for each spectral line, completely eliminating the spectral-line saturation overflow problem, with no need to worry about the influence of spectral-line saturation on adjacent lines.
Intelligent integration	Synchronous signal-background acquisition, with integration time depending on the light intensity of the spectral line, automatically calculating the optimal integration time, obtaining both high-intensity and weak signals at the best signal-to-noise ratio, broadening the dynamic range so that high- and low-content elements can be detected simultaneously, avoiding repeated sample dilution.
Detector surface	No light-conversion chemical coating on the detector surface, so detector replacement due to coating aging will not occur.
Sample introduction system	Standard quartz concentric nebulizer, quartz cyclone spray chamber, classic quartz double-barrel spray chamber, integrated quartz torch.
Optional argon online dilution	High-precision MFC-controlled argon efficiently dilutes high-salt samples above 10%, allowing direct injection.
Optional sample introduction	High-salt-resistant or HF-resistant sample introduction system, organic sample introduction system and hydride generator.
Gas path control	In the sample introduction system, the carrier gas, plasma gas and auxiliary gas are all controlled by advanced mass flow controllers (MFC), with advantages such as continuously adjustable flow and stable flow, ensuring the stability of the sample introduction system and providing a strong guarantee for light source stability.
Analysis speed	Approx. 25 elements per minute.
Sample consumption	Only 5 mL required.
Linear dynamic range	≥10⁵ (measured at Mn 257.6 nm, correlation coefficient ≥0.999).
Precision	Measuring a 1 ppm or 10 ppm multi-element mixed standard solution, RSD of ten repeated measurements ≤0.5%.
Stability	Measuring a 1 ppm or 10 ppm multi-element mixed standard solution, 8-hour long-term stability RSD ≤1%.
Detection limits (µg/L, per JJG 768-2005)	Zn 213.856 nm: 0.5; Ni 231.604 nm: 1; Mn 257.610 nm: 0.5; Cr 267.716 nm: 1; Cu 324.754 nm: 1; Ba 455.403 nm: 0.1.
Preheating time	From standby to plasma ignition less than 3 minutes.